| To: | Dave Chinner <david@xxxxxxxxxxxxx> |
|---|---|
| Subject: | Re: [PATCH 1/2] xfstests: make 225 use SCRATCH_DEV |
| From: | Alex Elder <aelder@xxxxxxx> |
| Date: | Thu, 13 Oct 2011 05:35:33 -0500 |
| Cc: | <xfs@xxxxxxxxxxx> |
| In-reply-to: | <1318212855-20212-2-git-send-email-david@xxxxxxxxxxxxx> |
| References: | <1318212855-20212-1-git-send-email-david@xxxxxxxxxxxxx> <1318212855-20212-2-git-send-email-david@xxxxxxxxxxxxx> |
| Reply-to: | <aelder@xxxxxxx> |
On Mon, 2011-10-10 at 13:14 +1100, Dave Chinner wrote: > From: Dave Chinner <dchinner@xxxxxxxxxx> > > Use the scratch device for test 225 so that both custom mkfs and > mount options impact the test (e.g. filesystem block size). This > exposes test failures when using 512 byte block sizes, which > currently not tested unless the test device is specifically created > with a 512 byte block size. > > Also clean up the file names to include the test number, and don't > remove the test files after the test has finished so that it leaves > behind a corpse that can be dissected when the test fails. > > Signed-off-by: Dave Chinner <dchinner@xxxxxxxxxx> Looks good. Reviewed-by: Alex Elder <aelder@xxxxxxx> |
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