| To: | david@xxxxxxxxxxxxx |
|---|---|
| Subject: | Re: [PATCH 07/10] xfstests: always us test option when checking large scratch device |
| From: | Paulo Alcantara <pcacjr@xxxxxxxxx> |
| Date: | Thu, 26 Jul 2012 14:21:13 -0300 (BRT) |
| Cc: | xfs@xxxxxxxxxxx |
| In-reply-to: | <1343291989-14987-8-git-send-email-david@xxxxxxxxxxxxx> |
| References: | <1343291989-14987-1-git-send-email-david@xxxxxxxxxxxxx> <1343291989-14987-8-git-send-email-david@xxxxxxxxxxxxx> |
Hi Dave,
From: Dave Chinner <david@xxxxxxxxxxxxx>
Date: Thu, 26 Jul 2012 18:39:46 +1000
> From: Dave Chinner <dchinner@xxxxxxxxxx>
>
> Some tests call _check_scratch_device directly and when using a
> large filesystem this needs to run with a -t option to avoid
> consuming large amounts of memory. Make this happen in all cases
> that the scratch device is checked.
>
> Signed-off-by: Dave Chinner <dchinner@xxxxxxxxxx>
> ---
> 017 | 7 ++-----
> common.rc | 2 ++
> 2 files changed, 4 insertions(+), 5 deletions(-)
I guess you meant "xfstests: always use test option..." instead in commit
message.
Paulo
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